SEDL / STP / STP1117-EB / STP26510S



Pulse-Width Dependence of Optical Coating Damage at 1052 nm

Yoshida, K
Institute of Laser Engineering Osaka University, Suita, Osaka,

Ikunishi, S
Institute of Laser Engineering Osaka University, Suita, Osaka,

Yoshida, H
Institute of Laser Engineering Osaka University, Suita, Osaka,

Kato, Y
Institute of Laser Engineering Osaka University, Suita, Osaka,

Nakai, S
Institute of Laser Engineering Osaka University, Suita, Osaka,


Pages: 1    Published: Jan 1990


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Source: STP1117-EB


Abstract

Pulse-width dependence of optical coating damages at 1053 nm laser wavelength is studied. Quarterwave-thick single layer films of high-index materials of A12O3, ZrO2 and TiO2, and low-index materials of MgF2 and SiO2 were tested. Damage thresholds of the MgF2 and SiO2 films follow the square root dependence on the pulse-width τ (√τ scaling) over the pulse widths of 0.35-90 ns. Although the damage thresholds of the A12O3, ZrO2 and TiO2 films followed the √τ scaling from 0.35 to 1 ns, they become independent of the pulse-width for the pulse-widths longer than 6 ns. That is, the pulse-width dependence of the damage threshold is determined by the absorption property of the coating layer, which controls the damage mechanism.


Paper ID: STP26510S
Committee/Subcommittee: E13.15
DOI: 10.1520/STP26510S
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