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The Effect of Laser Annealing on Laser Induced Damage Threshold Pages: 16 Published: Jan 1990
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View License Agreement Source: STP1117-EB Abstract A significant enhancement of the single shot Laser Induced Damage Threshold of CaF2 and fused silica and a moderate enhancement for GaAs and Al has been observed as the result of laser annealing using an excimer laser operating at 248 nm. This phenomenon is primarily attributed to a reduction of the residual surface roughness of the samples. Keywords: Excimer laser, Laser beam annealing, Laser induced damage Paper ID: STP26484S Committee/Subcommittee: E13.15 DOI: 10.1520/STP26484S ASTM International is a member of CrossRef. | ||