STP1117: Sensitive n2 Measurements Using a Single Beam

    Sheik-Bahae, M
    CREOL Center for Research in Electro Optics and Lasers University of Central Florida, Orlando, FL

    Said, AA
    CREOL Center for Research in Electro Optics and Lasers University of Central Florida, Orlando, FL

    Wei, TH
    CREOL Center for Research in Electro Optics and Lasers University of Central Florida, Orlando, FL

    Hagan, DJ
    CREOL Center for Research in Electro Optics and Lasers University of Central Florida, Orlando, FL

    Van Stryland, EW
    CREOL Center for Research in Electro Optics and Lasers University of Central Florida, Orlando, FL

    Soileau, MJ
    CREOL Center for Research in Electro Optics and Lasers University of Central Florida, Orlando, FL

    Pages: 10    Published: Jan 1990


    Abstract

    We present a sensitive single beam technique for measuring nonlinear refraction in a variety of materials that offers simplicity, sensitivity and speed. The transmittance of a sample is measured through a finite aperture in the far-field as the sample is moved along the propagation path (z) of a focused Gaussian beam. The sign and magnitude of the nonlinearity is easily deduced from such a transmittance curve (Z-scan). Employing this technique a sensitivity of better than λ/300 wavefront distortion is achieved in n2 measurements of BaF2 using picosecond visible laser pulses.

    Keywords:

    BaF, 2, CS, 2, experimental technique, Kerr effect, nonlinear refraction, Z-scan


    Paper ID: STP26481S

    Committee/Subcommittee: E13.15

    DOI: 10.1520/STP26481S


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