Digital Library / STP / STP1117-EB / STP26481S

Sensitive n2 Measurements Using a Single Beam
Sheik-Bahae, M
CREOL Center for Research in Electro Optics and Lasers University of Central Florida, FL

Said, AA

Wei, TH

Hagan, DJ

Van Stryland, EW

Soileau, MJ

Pages: 10    Published: Jan 1990

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Source: STP1117-EB

Abstract

We present a sensitive single beam technique for measuring nonlinear refraction in a variety of materials that offers simplicity, sensitivity and speed. The transmittance of a sample is measured through a finite aperture in the far-field as the sample is moved along the propagation path (z) of a focused Gaussian beam. The sign and magnitude of the nonlinearity is easily deduced from such a transmittance curve (Z-scan). Employing this technique a sensitivity of better than λ/300 wavefront distortion is achieved in n2 measurements of BaF2 using picosecond visible laser pulses.

Keywords:
BaF2, CS2, experimental technique, Kerr effect, nonlinear refraction, Z-scan

Paper ID: STP26481S
Committee/Subcommittee: E13.15
DOI: 10.1520/STP26481S
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