SEDL / STP / STP643-EB / STP25608S

X-Ray Photoelectron Spectroscopy and Secondary Ion Mass Spectrometry: A Multitechnique Approach to Surface Analysis

Shepard, A
Postdoctoral research associate, graduate student, lecturer, graduate student, and associate professorgraduate student and associate professor, School of Chemical Engineering, Purdue University, West Lafayette, Ind

Hewitt, RW
Postdoctoral research associate, graduate student, lecturer, graduate student, and associate professorgraduate student and associate professor, School of Chemical Engineering, Purdue University, West Lafayette, Ind

Baitinger, WE
Postdoctoral research associate, graduate student, lecturer, graduate student, and associate professorgraduate student and associate professor, School of Chemical Engineering, Purdue University, West Lafayette, Ind

Slusser, GJ
Postdoctoral research associate, graduate student, lecturer, graduate student, and associate professorgraduate student and associate professor, School of Chemical Engineering, Purdue University, West Lafayette, Ind

Winograd, N
Postdoctoral research associate, graduate student, lecturer, graduate student, and associate professorgraduate student and associate professor, School of Chemical Engineering, Purdue University, West Lafayette, Ind

Ott, GL
Postdoctoral research associate, graduate student, lecturer, graduate student, and associate professorgraduate student and associate professor, School of Chemical Engineering, Purdue University, West Lafayette, Ind

Delgass, WN
Postdoctoral research associate, graduate student, lecturer, graduate student, and associate professorgraduate student and associate professor, School of Chemical Engineering, Purdue University, West Lafayette, Ind

Pages: 17    Published: Jan 1978

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Abstract

The combination of X-ray photoelectron spectroscopy (XPS) with secondary ion mass spectroscopy (SIMS) promises to provide a powerful new approach both to quantitative analysis of surface composition and to the elucidation of surface molecular structure. In this work, we have tested our ultrahigh vacuum XPS/SIMS system to characterize a variety of metal, alloy, and metal oxygen surfaces. We report on the examination of clean silver surfaces where ions of clusters up to Agⁿ⁺ where n = 1 to 5 have been observed. Studies have also been carried out on iron/ruthenium catalyst surfaces and on clean indium foils exposed to controlled doses of oxygen. In general, we have tried to illustrate the advantages of this combined technique.