STP643: Some Aspects of Quantitative Surface Analysis by Electron Spectroscopy for Chemical Analysis

    Phillips, LV
    Research assistants, research associate, and professor, Department of Chemistry, University of Pittsburgh, Pittsburgh, Pa

    Salvati, L
    Research assistants, research associate, and professor, Department of Chemistry, University of Pittsburgh, Pittsburgh, Pa

    Carter, WJ
    Research assistants, research associate, and professor, Department of Chemistry, University of Pittsburgh, Pittsburgh, Pa

    Hercules, DM
    Research assistants, research associate, and professor, Department of Chemistry, University of Pittsburgh, Pittsburgh, Pa

    Pages: 17    Published: Jan 1978


    Abstract

    Application of surface-sensitive spectroscopic techniques to quantitative surface analysis requires consideration of the distribution of species on the surface, as well as the characteristics of the technique. For electron spectroscopy for chemical analysis (ESCA), these problems are considered for the following situations: material adsorbed on a surface at less than monolayer coverage, a thin film of surface species overlaying the bulk, a sample distributed throughout the bulk in an inhomogeneous fashion, and a multilayered system.

    Escape depth of photoelectrons becomes a particularly important parameter when comparing results of ESCA with those obtained by other techniques, such as Auger electron spectroscopy (AES). Different atomic ratios can be obtained from the same sample depending on the energies of electrons used.

    ESCA can be used for trace analysis by preconcentrating metal ions on surface. The effectiveness of this technique depends on the equilibrium between the surface and solution. The form of the calibration curve obtained is influenced by “saturation” effects. The kinetics of the surface-solution equilibrium are also important.

    Keywords:

    quantitative analysis, materials, spectroscopy, chemical analysis, Auger electrons, thin films, photoelectrons, trace elements, surface properties


    Paper ID: STP25599S

    Committee/Subcommittee: E42.03

    DOI: 10.1520/STP25599S


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