SEDL / STP / STP1045-EB / STP24612S

Dynamic Modulus Measurements and Materials Research

Berry, BS
Research Staff Member, T.J. Watson Research Center, Yorktown Heights, New York

Pages: 15    Published: Jan 1990

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Abstract

Dynamic modulus measurements are of interest in materials research not only as a source of data on elastic behavior, but also for the insight they provide into structure-property relationships in general. A description is given of a vibrating-reed apparatus which has proved highly adaptable for studies of the elastic and damping behavior of thin-film and other thin-layer electronic materials. Results are reported for amorphous and crystalline ferromagnetic materials, for the high-T^c superconducting oxide Y¹Ba²Cu³O^7-x, and for thin films of aluminum and silicon monoxide, to illustrate the important role which the dynamic modulus can play as a tool in materials research.