SYMPOSIA PAPER Published: 01 January 1991
STP23618S

Photoacoustic Characterization of Surface Absorption

Source

Photoacoustic spectrososcopy is used to characterize the surface absorption of polished fused silica substrates and thin films deposited on fused silica substrates. The extreme sensitivity of this technique allows measurement of surface absorptions of a few tenths of a part per million. Characterization of samples with surfaces finished using a variety of methods is reported.

Author Information

Reicher, DW
Wilson, SR
Kranenberg, CF
Raja, MYA
University of North Carolina at Charlotte, Charlotte, N. C.
McNeil, JR
Brueck, SRJ
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Details
Developed by Committee: F01
Pages: 106–112
DOI: 10.1520/STP23618S
ISBN-EB: 978-0-8031-5179-6
ISBN-13: 978-0-8194-0532-6