SEDL / STP / STP954-EB / STP23136S

Survey of Laser Damage Thresholds for High Reflector Films at 1.315 Microns

Deaton, TF
Frank J. Seiler Research Laboratory United States Air Force Academy, Colorado Springs, CO

Pages: 4    Published: Jan 1986

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Abstract

We present the results of a survey of laser-induced damage measurements for high-reflector films at 1.315 microns. A pulsed atomic iodine laser with a maximum output energy of 5 Joules in a pulsewidth of approximately 8 microseconds was used, with a spot diameter at the sample of about 2.8 mm. All the thresholds reported are for single shot per site illumination. The pulse energy, temporal profile, and spatial profile information were monitored for each shot.

The samples tested are part of an extensive survey of currently available coatings from several vendors and represent a wide variety of materials and designs. Each coating was prepared on both silicon and molydbenum substrates. Damage thresholds were defined by the presence of surface pitting visible under Nomarski microscopy. Threshold fluence levels ranged from 10 J/cm² to 150 J/cm² with uncertainties of typically ± 15%.