SEDL / STP / STP954-EB / STP23130S

Thermal Properties of Optical Thin Film Materials

Decker, DL
Michelson Laboratory, Physics Division Naval Weapons Center, China Lake, California

Koshigoe, LG
Michelson Laboratory, Physics Division Naval Weapons Center, China Lake, California

Ashley, EJ
Michelson Laboratory, Physics Division Naval Weapons Center, China Lake, California

Pages: 7    Published: Jan 1986

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Abstract

The performance of coatings for high power laser application depends not only on the optical properties of the films, but the thermal properties as well. An examination of the literature indicates that virtually all work has concerned the optical absorptance or reflectance, and that virtually no thermal property data are available for optical materials as thin films. Since it is known that the optical absorptance is often larger by orders of magnitude for a material as a thin film compared to bulk, a similar change (decrease) in thermal diffusivity might be expected. Of additional concern are the interfacial thermal barriers occurring at the boundaries between films. This paper presents experimental data for thin-film materials including Al²O³ and SiO² deposited in high vacuum. A simple theoretical analysis is also presented at well as recommendation for further work.