STP954

    Automated Pulsed Testing Using a Scatter-Probe Damage Monitor

    Published: Jan 1986


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    Abstract

    This paper describes automated pulsed testing of infrared mirrors based on scatter-probe detection of laser damage. Advantages of our approach are (1) ability to monitor minute changes in surface condition without an observer, (2) rapid sampling of a large matrix of test fluences and test positions on the mirror, (3) automatic selection of test fluences, (4) automatic control of laser intensity drift, and (5) compatibility with a vacuum test environment.

    Automated determination of damage frequencies and relative damage onsets will be described for single-layer-coated and uncoated metal and semiconductor mirrors. Tests were performed at 2.7 and 10.6 μm with 1/e2 focal spot diameters of 150 and 240 μm, respectively, using a nominal 100-ns pulse length in all cases. Results obtained with the scatter probe will be compared with those obtained from Nomarski postdamage analysis.

    Keywords:

    automation, CO, 2, DF, HeNe scatter, HF, laser, laser-induced damage, multilayer dielectric coating, onset, scatter probe


    Author Information:

    Franck, JB
    Michelson Laboratory, Physics Division Naval Weapons Center, China Lake, California

    Seitel, SC
    Michelson Laboratory, Physics Division Naval Weapons Center, China Lake, California

    Hodgkin, VA
    Michelson Laboratory, Physics Division Naval Weapons Center, China Lake, California

    Faith, WN
    Michelson Laboratory, Physics Division Naval Weapons Center, China Lake, California

    Porteus, JO
    Michelson Laboratory, Physics Division Naval Weapons Center, China Lake, California


    Paper ID: STP23108S

    Committee/Subcommittee: E13.03

    DOI: 10.1520/STP23108S


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