STP949

    Industrial Problem Solving by Microscopic Fourier Transform Infrared Spectrophotometry

    Published: Jan 1987


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    Abstract

    This paper is divided into two separate parts. The first part of the paper describes the permanent mount for an infrared microscope. The original design called for the microscope to be put in the infrared sample compartment of a Digilab FTS-15 spectrometer. Our changes allow the microscope to be permanently mounted using the original external beam configuration of the instrument with changes in the base plate optics on the microscope. The second part describes four analytical applications of the microscope showing how it can be used to substntially reduce sample preparation and allow examination of very small specimens. These four applications include identifying a lubricant in a nylon block, identifying a microcontaminant, elucidating an ink formulation, and looking at a multilayer polymer film.

    Keywords:

    micro Fourier transform infrared spectrophotometry (FT-IR), contaminant identification, FT-IR techniques


    Author Information:

    Miseo, EV
    Senior consultant and research assistant, Arthur D. Little, Inc., Cambridge, MA

    Guilmette, LW
    Senior consultant and research assistant, Arthur D. Little, Inc., Cambridge, MA


    Paper ID: STP19443S

    Committee/Subcommittee: E13.03

    DOI: 10.1520/STP19443S


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