STP1015: Computer-Controlled Facility for Laser Switching and Damage Testing

    Chivian, JS
    LTV Aerospace and Defense Company, Dallas, Texas

    Cotten, WD
    LTV Aerospace and Defense Company, Dallas, Texas

    Fuller, DF
    LTV Aerospace and Defense Company, Dallas, Texas

    Hemphill, RB
    LTV Aerospace and Defense Company, Dallas, Texas

    Scott, MW
    LTV Aerospace and Defense Company, Dallas, Texas

    Pages: 21    Published: Jan 1988


    Abstract

    Apparatus has been assembled for mostly-automatic laser switching and damage measurements in which dynamic events are followed in real time. Lasers, optical elements, and detectors are available for operation at 2.8 μm and at 10.6 μm. Sample exposure time is variable from 50 μs to cw. Sample positioning in X:Y:Z is controllable to 0.2 μm. Testing can be done with static beam position or with a scanning beam. Samples can be tested at ambient temperature, or from near 77°K to 370°K.

    Software provides for test control, data processing, and graphic, hard copy output. Beam profiling can be done automatically at the sample position, and the profile fit to a Gaussian of the same 1/e2 width. Sample data acquisition is sequenced by the computer after an enable pulse is given at the discretion of the experimenter. The computer records and processes the incoming data, presents intermediate data display, completes data manipulation, and compares processed measurement data with internally available prediction models in graphic form. Representative output for a thin film nonlinear optical material is shown.

    Keywords:

    automated testing, dynamic real time testing, laser-induced damage, laser-induced switching


    Paper ID: STP18718S

    Committee/Subcommittee: F01.18

    DOI: 10.1520/STP18718S


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