SEDL / STP / STP1028-EB / STP18572S



Long-Range Pulselength Scaling of 351 nm Laser Damage Thresholds

Foltyn, SR
Los Alamos National Laboratory, Los Alamos, NM

Jolin, LJ
Los Alamos National Laboratory, Los Alamos, NM


Pages: 8    Published: Jan 1988


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Abstract

In a series of experiments incorporating 351-nm pulselengths of 9, 26, 54, and 625 ns, it was found that laser damage thresholds increased as (pulselength)X, and that the exponent averaged 0.36 and ranged, for different samples, from 0.23 to 0.48. Similar results were obtained when only catastrophic damage was considered. Samples included Al2O3/SiO2 in both AR and HR multilayers, HR's of Sc2O3/SiO2 and HfO2/SiO2, and an Al-on-pyrex mirror; 9-ns thresholds were between 0.2-5.6 J/cm2.

When these data were compared with a wide range of other results — for wavelengths from 0.25 to 10.6 μm and pulselengths down to 4 ps — a remarkably consistent picture emerged. Damage thresholds, on average, increase approximately as the cube-root of pulselength from picoseconds to nearly a microsecond, and do so regardless of wavelength or material under test.


Keywords:
A1, 2, O, 3, catastrophic damage, coating defects, damage thresholds, excimer lasers, HfO, 2, multilayer dielectric coatings, pulselength scaling, Sc, 2, O, 2, XeF lasers

Paper ID: STP18572S
Committee/Subcommittee: F01.10
DOI: 10.1520/STP18572S
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