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Photothermal Measurement of Optical Coating Thermal Transport Properties Pages: 8 Published: Jan 1988
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View License Agreement We report the present status of a project to measure the thermal transport properties of optical coating materials in thin-film format. The measurement technique employs a noncontact nondestructive method based on thermal diffusion-wave interferometry. Initial results confirm the feasibility of the method. Data on nickel coatings show thin film transport parameters slightly smaller than corresponding bulk values, and in addition clearly display the effects of a nonideal thermal bond between the coating and the substrate. | ||