Scatter Intensity Mapping of Laser-Illuminated Coating Defects

    Published: Jan 1988

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    The ability to detect and locate defects nondestructively in multilayer optical coatings has been demonstrated using a video microscopy system. The system uses laser-excited scattering to illuminate defects responsible for laser-induced damage in multi-layer dielectric mirrors. So far, attempts to predict the particular defect that will initiate damage have been unsuccessful. Presently, intensity maps and contours can be generated by digitizing the video images of scattering from individual defects. These can reveal characteristic defect scatter features possibly related to damage probability, and they offer a means to follow the development of these features from incipient to catastrophic damage. Examples of defect scatter maps and intensity contours for a dielectric mirror will be presented and discussed.


    coating defects, defect scattering, dielectric mirrors, laser damage, light scatter, surface scatter, thin films, video-image processing

    Author Information:

    Moran, MB
    Naval Weapons Center, China Lake, California

    Kuo, RH
    Naval Weapons Center, China Lake, California

    Marrs, CD
    Naval Weapons Center, China Lake, California

    Committee/Subcommittee: F01.02

    DOI: 10.1520/STP18557S

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