SEDL / STP / STP1028-EB / STP18552S

Variations with Laser Pulse Duration of the Thresholds at 350-nm and 1064-nm for Bulk Damage in Crystals of KDP

Gonzales, RP
Lawrence Livermore National Laboratory University of California, Livermore, California

Staggs, MC
Lawrence Livermore National Laboratory University of California, Livermore, California

Singleton, MF
Lawrence Livermore National Laboratory University of California, Livermore, California

George, D
Lawrence Livermore National Laboratory University of California, Livermore, California

Weinzapfel, CL
Lawrence Livermore National Laboratory University of California, Livermore, California

Weinzapfel, S
Lawrence Livermore National Laboratory University of California, Livermore, California

Pages: 1    Published: Jan 1988

Download this paper for $25 PDF (16K)          View License Agreement
Abstract

Five separate laser facilities were used to measure 350-nm and 1064-nm thresholds for bulk damage in crystals of KDP. At 1064-nm, tests were made with single laser pulses having durations of 1, 9 and 25 ns and with 9-ns pulses incident at 10 Hz. At 350-nm test were made with single pulses having durations of 0.6, 5.0 and 25 ns and with 25-nm pulses incident at rates up to 50 Hz. Over the range from 0.6 to 25 ns, 350-nm thresholds increased by a factor of approximately 2, and 350-nm thresholds were almost independent of laser repetition rate. The 1064-nm thresholds increased by a factor > 3 as pulse duration increased from 1 to 25 ns. Laser hardening of thresholds was observed at both 350-nm and 1064-nm.