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    Principles and Applications of Photoelectron and Ion Spectroscopy for the Analysis of Polymer Surfaces

    Published: Jan 1992

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    Advances in the development of techniques for the energy and mass analysis of ejected particles, form the basis of their use as surface analytical spectroscopies. Methods such as X-ray photoelectron spectroscopy (XPS or ESCA), low-energy ion-scattering spectroscopy (ISS), and secondary ion mass spectrometry (SIMS) are becoming more widely applicable to problems in the chemical analysis of coatings surfaces and interfaces. In this paper a brief review of instrumentation and theory allows projection of new capabilities for the method. Recent progress in the analysis of homopolymer and multicomponent polymer interfaces is described.


    surface analysis, polymer surface science, ESCA, XPS, low-energy ion scattering, SIMS, multicomponent polymers, functional polymers, polymer/metal interfaces

    Author Information:

    Gardella, JA
    Professor of chemistry, University at Buffalo, SUNY, Buffalo, NY

    Committee/Subcommittee: D01.21

    DOI: 10.1520/STP17853S

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