STP1119

    Principles and Applications of Photoelectron and Ion Spectroscopy for the Analysis of Polymer Surfaces

    Published: Jan 1992


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    Abstract

    Advances in the development of techniques for the energy and mass analysis of ejected particles, form the basis of their use as surface analytical spectroscopies. Methods such as X-ray photoelectron spectroscopy (XPS or ESCA), low-energy ion-scattering spectroscopy (ISS), and secondary ion mass spectrometry (SIMS) are becoming more widely applicable to problems in the chemical analysis of coatings surfaces and interfaces. In this paper a brief review of instrumentation and theory allows projection of new capabilities for the method. Recent progress in the analysis of homopolymer and multicomponent polymer interfaces is described.

    Keywords:

    surface analysis, polymer surface science, ESCA, XPS, low-energy ion scattering, SIMS, multicomponent polymers, functional polymers, polymer/metal interfaces


    Author Information:

    Gardella, JA
    Professor of chemistry, University at Buffalo, SUNY, Buffalo, NY


    Paper ID: STP17853S

    Committee/Subcommittee: D01.21

    DOI: 10.1520/STP17853S


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