SYMPOSIA PAPER Published: 01 January 1999
STP15774S

Description of Crack Growth Using the Strip-Yield Model for Computation of Crack Opening Loads, Crack Tip Stretch, and Strain Rates

Source

Nowadays, application of the strip-yield model for computation of crack opening load levels is well known. In this paper the incremental formulation of a fatigue crack growth law is used to demonstrate the role of the crack opening load level in time-independent fatigue crack growth. Less known is the ability of the strip-yield model to define the strain rate at the crack tip. A threshold level εth of this strain rate is introduced and used to formulate a criterion for initiation of time-dependent accelerated fatigue crack growth. This process is called corrosion fatigue. To account for effects of environment and frequency on the crack growth rate a time-dependent part is added to the incremental fatigue crack growth law. The resulting incremental crack growth equation is integrated to obtain the crack growth rate for a load cycle.

The model discussed in this paper is a mechanical model. Physical aspects other than strain rate, loading frequency and load wave shape are not modeled in an explicit way. Hence, the model is valid for specific environment/base metal combinations. However, in consideration of the effects of small variations of environment, temperature, and other variables on the crack growth rates, it can be used as a reference solution.

The fatigue crack growth model has been implemented in the NASGRO (ESACRACK) software. The time-dependent part is still subject to further evaluation.

Author Information

de Koning, AU
National Aerospace Laboratory (NLR), NOP, The Netherlands
ten Hoeve, HJ
National Aerospace Laboratory (NLR), NOP, The Netherlands
Henriksen, TK
European Space Agency (ESA), ESTEC, Noordwijk, The Netherlands
Price: $25.00
Contact Sales
Related
Reprints and Permissions
Reprints and copyright permissions can be requested through the
Copyright Clearance Center
Details
Developed by Committee: E08
Pages: 459–474
DOI: 10.1520/STP15774S
ISBN-EB: 978-0-8031-5397-4
ISBN-13: 978-0-8031-2611-4