SYMPOSIA PAPER Published: 30 October 2014
STP157620140014

In-Situ Synchrotron X-Ray Study of the Elevated Temperature Deformation Response of SS 316L Pressurized Creep Tubes

Source

A high-energy diffraction technique is presented that uses synchrotron X-rays to characterize the in situ deformation response of pressurized creep tubes at elevated temperature. In addition to the X-ray diffraction measurement, the technique allows the macroscopic creep strain to be measured simultaneously during X-ray exposure. We demonstrated this technique in two areas at different temperatures in the tube specimen. From the X-ray diffraction patterns, we obtained a typical creep curve with identifiable secondary and tertiary creep response at the high temperature area, and only observed the secondary creep response at the low temperature area. The diffraction peak broadening analysis directly showed the development of the dislocation structures and lattice strain during deformation and make it possible to track the development of creep void nucleation, growth and coalescence.

Author Information

Mo, Kun
Department of Nuclear, Plasma, and Radiological Engineering, Univ. of Illinois at Urbana–Champaign, Urbana, IL, US Argonne National Laboratory, Argonne, IL, US
Tung, Hsiao-Ming
Institute of Nuclear Energy Research, Longtan, Taoyuan, TW
Chen, Xiang
Oak Ridge National Laboratory, Oak Ridge, TN, US
Yun, Di
Argonne National Laboratory, Argonne, IL, US
Miao, Yinbin
Department of Nuclear, Plasma, and Radiological Engineering, Univ. of Illinois at Urbana–Champaign, Urbana, IL, US
Chen, Weiying
Department of Nuclear, Plasma, and Radiological Engineering, Univ. of Illinois at Urbana–Champaign, Urbana, IL, US
Almer, Jonathan
Argonne National Laboratory, Argonne, IL, US
Novak, April
Department of Nuclear, Plasma, and Radiological Engineering, Univ. of Illinois at Urbana–Champaign, Urbana, IL, US
Stubbins, James, F.
Department of Nuclear, Plasma, and Radiological Engineering, Univ. of Illinois at Urbana–Champaign, Urbana, IL, US
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Details
Developed by Committee: E10
Pages: 1–12
DOI: 10.1520/STP157620140014
ISBN-EB: 978-0-8031-7598-3
ISBN-13: 978-0-8031-7597-6