STP1228

    Intercomparison of Neutron Test Facilities for Equivalent Damage to Electronics

    Published: Jan 1994


      Format Pages Price  
    PDF Version (80K) 6 $25   ADD TO CART
    Complete Source PDF (15M) 6 $131   ADD TO CART


    Abstract

    Neutron-sensitive diodes are practical monitors for comparing damage delivered to electronic devices among different test facilities. Heat treatment of the diodes before readout is shown to eliminate effects of temperature variations between exposure and readout. This allows the comparisons to be done on a mail-in basis. The results of such a comparison among several neutron facilities is presented.

    Keywords:

    neutron damage, neutron dosimetry, 1 MeV equivalence, damage intercomparison


    Author Information:

    Heimbach, CR
    Physicist, Combat Systems Test Activity, STECS-NE, MD


    Paper ID: STP15146S

    Committee/Subcommittee: E10.08

    DOI: 10.1520/STP15146S


    CrossRef ASTM International is a member of CrossRef.