SEDL / STP / STP1203-EB / STP14897S

Recent Developments in Quantitative Fractography

Gokhale, AM
School of Materials Engineering, Georgia Institute of Technology, Atlanta, GA

Drury, WJ
School of Materials Engineering, Georgia Institute of Technology, Atlanta, GA

Mishra, S
School of Materials Engineering, Georgia Institute of Technology, Atlanta, GA

Pages: 20    Published: Jan 1993

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Abstract

Quantitative characterization of fracture surface topography is an important aspect of quantitative fractography. This contribution is concerned with the profilometric methods for the estimation of the important descriptors of the fracture surface topography. The parameters such as fracture surface roughness, tortuosity, fraction overlap, etc. are defined, and the profilometric measurements that enable the estimation of such parameters are described. Recent experimental data on the surface roughness and fractal dimension pertaining to creep and impact fracture surfaces are presented to demonstrate the utility of the topographic parameters.