STP1220: Residual Stress Measurement in Sapphire-Fiber Composites: Through-Focus and Transmission Fluorescence Spectroscopy

    Lipkin, DM

    Clarke, DR
    Graduate student researcher and professor, University of California, Santa Barbara, CA

    Pages: 14    Published: Jan 1995


    Abstract

    A method to non-intrusively measure stresses both at and below the surface of structural components is developed. Based on the piezo-spectroscopic effect in optical fluorescence, this technique affords high-accuracy stress measurement with spatial resolution on the order of one micron. The theoretical basis for the piezo-spectroscopic effect is reviewed, and several concepts relevant to its application are established. The applicability of fluorescence spectroscopy to stress measurement is demonstrated on two sapphire-fiber reinforced composites, one with γ-TiAl and the other with α-Ti as the matrix. The residual stress distributions along the fibers are measured using a through-focusing procedure, and a mean volume stress is determined using a transmission fluorescence configuration. The effective temperature below which residual stresses can no longer be relieved by creep and yielding is determined using an elastic model. In the TiAl-matrix composite, this temperature is approximately 400‡C below the processing temperature, indicating extensive stress relaxation during cooling. The elastic solution fails to provide a reasonable estimate of the stress-free temperature for the Ti-matrix system. This is attributed to extensive matrix yielding, and a complete treatment will require incorporation of inelastic constitutive behavior into the model.

    Keywords:

    stress measurement, residual stress, piezo-spectroscopy, fluorescence, sapphire, ruby, TiAl matrix, Ti matrix


    Paper ID: STP14596S

    Committee/Subcommittee: E08.09

    DOI: 10.1520/STP14596S


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