STP1325

    Behavior of Fe-Cr-Ni-xP-yTi Alloys under Electron/He Ion Dual Beam Irradiation

    Published: Jan 1999


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    Abstract

    The effect of helium on microstructural development during dual beam irradiation with electrons/ He+ ions was examined for Fe-16wt%Cr-14wt%Ni-xwt%P-ywt%Ti (x=0, 0.1, y=0, 0.1) model alloys. Irradiation was carried out using a high voltage electron microscope (1000kv) connecting with 300 keV ion accelerator. The simultaneous ion injection rate was 20 at.ppm He/ dpa at 70KeV and irradiation temperatures were 723 K and 773K. In the phosphorus containing alloy, vacancy type dislocation loops were nucleated in the early irradiation stage with electrons beam irradiation. Voids were nucleated from lower dose during electrons/ He+ ions dual beam irradiations. In the titanium contained alloy, under electrons/ He ions dual irradiation, void nucleation was lower comparing to phosphorus containing alloy under electron beam. Furthermore, structural development in alloy containing both titanium and phosphorous was similar to that of alloy with phosphorus and dislocation density was very high. From these results it was clarified that helium strongly influences void nucleation in each alloy as a result of interaction between phosphorus and interstitials

    Keywords:

    Helium, Dual-beam irradiation, Voids, electron irradiation, Fe-Cr-Ni alloy, Titanium and phosphorus addition


    Author Information:

    Takahashi, H
    Professor, Center for Advanced Research of Energy Technology, HokkaidoUniversity, Sapporo,

    Tsuchida, H
    Graduate student, Faculty of Engineering, Hokkaido University, Sapporo,

    Hidaka, Y
    Graduate student, Faculty of Engineering, Hokkaido University, Sapporo,

    Kinoshita, H
    Instructors, Center for Advanced Research of Energy Technology, Hokkaido University, Sapporo,

    Watanabe, S
    Instructors, Center for Advanced Research of Energy Technology, Hokkaido University, Sapporo,


    Paper ID: STP13898S

    Committee/Subcommittee: E10.07

    DOI: 10.1520/STP13898S


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