STP1325

    Use of Forces from Instrumented Charpy V-Notch Testing to Determine Crack-Arrest Toughness

    Published: Jan 1999


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    Abstract

    The objective of this investigation is an estimation of the crack-arrest toughness, particularly of irradiated materials, from voltage versus time output of an instrumented tup during a test on a Charpy V-notch (CVN) specimen. This voltage versus time trace (which can be converted to force versus displacement) displays events during fracture of the specimen. Various stages of the fracture process can be identified on the trace, including an arrest point indicating arrest of brittle fracture. The force at arrest, Fa, versus test temperature, T, relationship is examined to explore possible relationships to other experimental measures of crack-arrest toughness such as the drop-weight nil-ductility temperature (NDT), or crack-arrest toughness, Ka. For a wide range of weld and plate materials, the temperature at which Fa = 2.45 kN correlates with NDT with a standard deviation, σ, of about 11 K. Excluding the so-called “low upper-shelf energy” (USE) welds from the analysis resulted in Fa = 4.12 kN and σ = 6.6 K. The estimates of the correlation of the temperature for Fa = 7.4 kN with the temperature at 100-MPa·√m level for a mean American Society of Mechanical Engineers (ASME) type KIa curve through crack-arrest toughness values show that prediction of conservative values of Ka are possible.

    Keywords:

    instrumented Charpy, crack-arrest toughness, nil-ductility transition temperature, NDT, irradiation embrittlement, reactor pressure vessel steels


    Author Information:

    Iskander, SK
    Oak Ridge National Laboratory, Oak Ridge, TN

    Nanstad, RK
    Oak Ridge National Laboratory, Oak Ridge, TN

    Sokolov, MA
    Oak Ridge National Laboratory, Oak Ridge, TN

    McCabe, DE
    Oak Ridge National Laboratory, Oak Ridge, TN

    Hutton, JT
    Oak Ridge National Laboratory,

    Thomas, DL
    Oak Ridge National Laboratory,


    Paper ID: STP13865S

    Committee/Subcommittee: E10.07

    DOI: 10.1520/STP13865S


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