STP1226

    Scanning Electron Microscopy/X-Ray Fluorescence Characterization of Lead-Rich Post-Abatement Dust

    Published: Jan 1995


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    Abstract

    Scanning electron microscopy (SEM) and laboratory X-ray fluorescence (XRF) were used to characterize post-abatement dust collected with a HEPA filter. Three size fractions of resuspended dust (0–150 μm, 2.5–15 μm, and <2.5 μm) were collected on teflon filters and analyzed by energy-dispersive XRF. Automated SEM was used to determine the size, morphology, and chemistry of individual particles from 0.2 μm to greater than 250 μm. Minerals associated with construction materials, paint fillers, and soil were the dominant species in all size fractions. Lead-rich particles were found in all sizes and could be grouped into three categories: lead-only (includes lead oxide and lead carbonate), mixed lead/minerals, and automotive lead. Isolated lead oxide or lead carbonate particles derived from paint pigments were the dominant form of the lead-bearing particles in the size fraction <15 μm.

    Keywords:

    lead, dust, scanning electron microscopy, X-ray fluorescence, post-abatement, paint


    Author Information:

    Mamane, Y
    Associate Professor, Technion, Haifa,

    Willis, RD
    Research Scientist, ManTech Environmental, Research Triangle Park, NC

    Stevens, RK
    Chief, U.S. Environmental Protection Agency, Research Triangle Park, NC

    Miller, JL
    Senior Consultant, US EPA, Research Triangle Park, NC


    Paper ID: STP12980S

    Committee/Subcommittee: D18.03

    DOI: 10.1520/STP12980S


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