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Scanning Electron Microscopy/X-Ray Fluorescence Characterization of Lead-Rich Post-Abatement Dust Pages: 15 Published: Jan 1995
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View License Agreement Source: STP1226-EB Abstract Scanning electron microscopy (SEM) and laboratory X-ray fluorescence (XRF) were used to characterize post-abatement dust collected with a HEPA filter. Three size fractions of resuspended dust (0150 m, 2.515 m, and <2.5 m) were collected on teflon filters and analyzed by energy-dispersive XRF. Automated SEM was used to determine the size, morphology, and chemistry of individual particles from 0.2 m to greater than 250 m. Minerals associated with construction materials, paint fillers, and soil were the dominant species in all size fractions. Lead-rich particles were found in all sizes and could be grouped into three categories: lead-only (includes lead oxide and lead carbonate), mixed lead/minerals, and automotive lead. Isolated lead oxide or lead carbonate particles derived from paint pigments were the dominant form of the lead-bearing particles in the size fraction <15 m.
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