SYMPOSIA PAPER Published: 01 January 2000
STP12448S

An Investigation into the Origin and Nature of the Slope and x-axis Intercept of the Shear Punch-Tensile Yield Strength Correlation using Finite Element Analysis

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Recent studies have shown that for a variety of unirradiated and irradiated materials, a slope of ∼2 is obtained for a correlation between yield in a shear punch test and yield in a uniaxial tensile test. Application of the von Mises yield criterion would predict a slope of √3. A finite element model (FEM) of the shear punch test was developed to aid in understanding the experimentally obtained slope of ∼2. FEM simulations of the shear punch test were conducted using stress-strain data from uniaxial tensile tests on 316 stainless steel in four initial cold-work conditions. A correlation was developed between the FEM-evaluated effective shear yield strength and the experimentally-evaluated uniaxial yield strength. The slope from this correlation was found to be nearly the same as for the slope from the correlation between the experimentally-evaluated effective shear yield strength and the experimentally-evaluated uniaxial yield strength. The finite element model showed that stresses other than pure shear exist in a specimen during a shear punch test, and these other stresses may explain why the slope of the experimental yield strength correlation is different than √3.

Author Information

Hankin, GL
I.P.T.M.E., Loughborough University, Leicestershire, UK
Toloczko, MB
Washington State University, Pullman, WA, USA
Johnson, KI
Pacific Northwest National Laboratory, Richland, WA, USA
Khaleel, MA
Pacific Northwest National Laboratory, Richland, WA, USA
Hamilton, ML
Pacific Northwest National Laboratory, Richland, WA, USA
Garner, FA
Pacific Northwest National Laboratory, Richland, WA, USA
Davies, RW
Pacific Northwest National Laboratory, Richland, WA, USA
Faulkner, RG
I.P.T.M.E., Loughborough University, Leicestershire, UK
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Details
Developed by Committee: E10
Pages: 1018–1028
DOI: 10.1520/STP12448S
ISBN-EB: 978-0-8031-5419-3
ISBN-13: 978-0-8031-2852-1