SEDL / STP / STP1318-EB / STP11901S



An Array Measurement System for Thermoelastic Stress Analysis

Welch, CS
Sr. Research Scientist, College of William and Mary, Williamsburg, VA

Cramer, KE
Aerospace Technologist, NASA Langley Research Center, Hampton, VA

Lesniak, JR
Vice-President and President, Stress Photonics, Inc., Madison, WI

Boyce, BR
Vice-President and President, Stress Photonics, Inc., Madison, WI


Pages: 10    Published: Jan 1997


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Abstract

Thermoelastic Stress Analysis (TSA) is defined, and an overview is given to show its potentially wide applicability and brief history. A simplified calculation of instrumental response characteristics shows the substantial improvement in data acquisition speed that can be gained in a system using a staring array in comparison to that using a scanned detector. Descriptions are given of several methods which have been used to obtain data for thermoelastic stress analysis. Finally, image representations are presented of TSA data taken with a staring array imager showing the resolution attainable in practice using some laboratory fatigue samples and a prototype part.


Keywords:
thermoelastic stress analysis, full-field stress analysis, stress imaging, staring infrared detector arrays

Paper ID: STP11901S
Committee/Subcommittee: E08.03
DOI: 10.1520/STP11901S
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