Published: Jan 2001
| ||Format||Pages||Price|| |
|PDF (292K)||10||$25||  ADD TO CART|
|Complete Source PDF (7.7M)||334||$110||  ADD TO CART|
Due to its many excellent properties, diamond is being explored as a material for MicroElectroMechanical Systems (MEMS). However, as is true in the case of silicon, a large amount of basic material characterization issues still warrant investigation. This paper presents preliminary results from charged particle irradiation of Chemical Vapor Deposited (CVD) polycrystalline diamond films. The films were simultaneously dosed to a level of 9.4 × 10th particles/cm2 using 700 keV protons and 1 MeV electrons. The samples were then subject to cross-sectional nanoindention analysts and Raman spectroscopy. Polycrystalline silicon was also investigated for comparison purposes. The diamond was unaffected by the irradiation. However, the silicon did indicate a slight decrease in Young's modulus.
CVD diamond, polycrystalline silicon, radiation effects, nanoindention, Raman Spectroscopy, MEMS, hardness, Young's Modulus, cross-sectional
Materials Engineer, NASA Marshall Space Flight Center, Huntsville, AL
Professor, Vanderbilt University, Nashville, TN