SEDL / STP / STP1416-EB / STP10640S



Principles for Recovering Micro-Stress in Multi-Level Analysis

Wang, Y
Associate professor and corresponding author, graduate student, and research associate, Mechanical and Nuclear Engineering, Kansas State University, Manhattan, KS

Sun, C
Associate professor and corresponding author, graduate student, and research associate, Mechanical and Nuclear Engineering, Kansas State University, Manhattan, KS

Sun, X
Associate professor and corresponding author, graduate student, and research associate, Mechanical and Nuclear Engineering, Kansas State University, Manhattan, KS

Pagano, NJ
Senior Scientist, AFRL/MLBC, OH


Pages: 12    Published: Jan 2002


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Abstract

Multi-level stress analysis is widely used to recover the micro-stress of the stress concentration area in composite structures. One common approach is firstly to consider the composite material as a homogeneous material. Effective properties are employed to predict the effective stress and effective displacement fields (or called the macroscopic stress and macroscopic displacement fields). Then, a local domain, which includes the area of interest (normally the stress concentration area), is selected for local microscopic stress analysis, in which the effective stress and/or effective displacement along the local domain boundary are used as boundary conditions. Thus a question arises: can the micro-stress field in the area of interest found from multi-level stress analysis match that from full-field micro-stress analysis? In this paper, two principles and a “local domain test”, which is based upon the two principles, are established for multi-level stress analysis. It is shown that micro-stress in the area of interest will be recovered accurately with multi-level analysis if the selected local domain passes the “local domain test.” These two principles and the “local domain test” elevate multi-level stress analysis into a more powerful tool.


Keywords:
Micro-mechanics, multi-level analysis, homogenization

Paper ID: STP10640S
Committee/Subcommittee: D30.05
DOI: 10.1520/STP10640S
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