MONO9

    Wavelength Dispersive X-ray Spectrometry

    Published: Jan 2011

      Format Pages Price  
    PDF (416K) 25 $25   ADD TO CART
    Complete Source PDF (31M) 25 $197   ADD TO CART


    Abstract

    The wavelength range of interest in X-ray fluorescence (XRF) spectrometry is roughly the range between 0.04 and 2 nm. This allows the analysis of the elements from fluorine upward to the transuranics, either on their K or L characteristic lines. Using special precautions and dedicated multilayers (see section on “Diffraction and the Analyzing Crystal”), the range can be enlarged to 11 nm, including the characteristic lines of beryllium. Energy and wavelength are related according to the following equation: E=hcλ where E is the photon energy; h is Planck's constant (6.626 10−34 J s, or 4.135 10−15 eV s); c is the speed of light in vacuum (3×108m/s); and λ is wavelength. By substituting these values in Eq 1, and expressing photon energy in kiloelectronvolts and wavelength in nanometres, the following is obtained: E=1.24λ or λ=1.24E


    Author Information:

    Vrebos, Bruno A. R.
    PANalyticol B.V., Almelo,

    Glose, Timothy L.
    PANalytical Inc., Westborough, MA


    Paper ID: MONO10129M

    Committee/Subcommittee: D02.03

    DOI: 10.1520/MONO10129M


    CrossRef ASTM International is a member of CrossRef.

    ISBN10:
    ISBN13: 978-0-8031-7020-9