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    Electron Microscopy-Scanning Probe Microscopy

    Published: Jan 2007

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    AN IN-DEPTH DESCRIPTION OF ELECTRON MICROSCOPY AND SCANNING probe microscopy falls outside the scope of this book, but in this chapter a short introduction is given to the transmission electron microscope (TEM), the scanning electron microscope (SEM), the focused ion beam techniques (FIB), and a number of scanning probe microscopes (SPM).


    Metallography, Materialography, Preparation methods, Sample preparation, Mechanical polishing, Electrolytic polishing, Cutting, Sectioning, Hot mounting, Cold mounting, Grinding, Polishing, Polishing artifact, Etching, Microscope, Quantitative metallography, Stereology, Vickers hardness, Quality control, Microstructure

    Committee/Subcommittee: E04.11

    DOI: 10.1520/MNL11196M

    CrossRef ASTM International is a member of CrossRef.

    ISBN10: 0-8031-4265-X
    ISBN13: 978-0-8031-4265-7