Digital Library / Manuals and Monographs / MNL46-EB / MNL11196M



Electron Microscopy-Scanning Probe Microscopy


Pages: 4    Published: Jan 2007


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Source: MNL46-EB


First Paragraph

AN IN-DEPTH DESCRIPTION OF ELECTRON MICROSCOPY AND SCANNING probe microscopy falls outside the scope of this book, but in this chapter a short introduction is given to the transmission electron microscope (TEM), the scanning electron microscope (SEM), the focused ion beam techniques (FIB), and a number of scanning probe microscopes (SPM).


Paper ID: MNL11196M
Committee/Subcommittee: E04.11
DOI: 10.1520/MNL11196M
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ISBN10: 0-8031-4265-X
ISBN13: 978-0-8031-4265-7