MNL46

    Electron Microscopy-Scanning Probe Microscopy

    Published: Jan 2007

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    Abstract

    AN IN-DEPTH DESCRIPTION OF ELECTRON MICROSCOPY AND SCANNING probe microscopy falls outside the scope of this book, but in this chapter a short introduction is given to the transmission electron microscope (TEM), the scanning electron microscope (SEM), the focused ion beam techniques (FIB), and a number of scanning probe microscopes (SPM).

    Keywords:

    Metallography, Materialography, Preparation methods, Sample preparation, Mechanical polishing, Electrolytic polishing, Cutting, Sectioning, Hot mounting, Cold mounting, Grinding, Polishing, Polishing artifact, Etching, Microscope, Quantitative metallography, Stereology, Vickers hardness, Quality control, Microstructure


    Paper ID: MNL11196M

    Committee/Subcommittee: E04.11

    DOI: 10.1520/MNL11196M


    CrossRef ASTM International is a member of CrossRef.

    ISBN10: 0-8031-4265-X
    ISBN13: 978-0-8031-4265-7