Editor-in-Chief

    Dr. M. R. Mitchell, Mechanics & Materials, LLC, Flagstaff, AZ, USA

    Editorial Board Members

    • Dr. Aziz Amoozegar, North Carolina State University, Raleigh, NC, USA
    • Dr. Patricia A. Annis, University of Georgia, Athens, GA, USA
    • Dr. Nemkumar Banthia, University of British Columbia, Vancouver, BC, Canada
    • Dr. Neal S. Berke, Tourney Consulting Group, Ltd., Kalamazoo, MI, USA
    • Dr. Krishna Prapoorna Biligiri, Indian Institute of Technology, Kharagpur, West Bengal, INDIA
    • Dr. Nick Birbilis, Monash University, Clayton, VIC 3800, Australia
    • Dr. Laura Bix, Michigan State University, East Lansing, MI, USA
    • Dr. Andrew F. Braham, University of Arkansas, Fayetteville, AR, USA
    • Dr. Andreas J. Brunner, EMPA, Swiss Federal Laboratories, Duebendorf, Switzerland
    • Professor Andrea Carpinteri, University of Parma, Parma, ITALY
    • Dr. Wen-Ruey Chang, Liberty Mutual Research Institute for Safety, Hopkinton, MA, USA
    • Dr. Dar-Hao Chen, Texas Dept. of Transportation, Austin, TX, USA
    • Dr. Haiqiiang Chen, Xiamen University, Fujan, China
    • Ms. Geraldine S. Choek, National Institute of Standards and Technology (NIST), Gaithersburg, MD, USA
    • Dr. Richard A. Coffman, University of Arkansas, Fayetteville, AR, USA
    • Dr. Tong Cui, Qualcomm Packaging, San Diego, CA, USA
    • Mr. John S. Dick, Alpha Technologies, Akron, OH, USA
    • Prof. Ying Fang, Xiamen University, Xiamen, China
    • Dr. Peter E. Fortini, Pfizer/Wyeth, Andover, MA, USA
    • Dr. T. Russell Gentry, Georgia Institute of Technology, Atlanta, GA, USA
    • Dr. Yu-Ning Louis Ge, National Taiwan University, Taipei, Taiwan
    • Dr. Markus B. Heinimann, Alcoa Technical Center, Alcoa Center, PA, USA
    • Mr. Hui-Min (Hui) Huang, National Institute for Standards and Technology (NIST), Gaithersburg, MD, USA
    • Dr. Shin-Che Huang, Western Research Institute, Laramie, WY, USA
    • Dr. Jiancheng Jiang, University of North Carolina at Charlotte, Charlotte, NC, USA
    • Dr. Tao Jiang, University of Connecticut Health Center, Farmington, CT, USA
    • Mr. Thomas S. Jones, Howmet Research Corp., Whitehall, MI, USA
    • Dr. Sivakumar Kandasami, Independent Structural Consultant, Coimbatore, India
    • Dr. Sreeramesh Kalluri, Ohio Aerospace Institute, Brook Park, OH, USA
    • Dr. Vistasp Karbhari, University of Texas at Arlington, Arlington, TX, USA
    • Dr. Edward J. Kikta, Jr., FMC Corporation, Ewing, NJ, USA
    • Dr. Yong-Rak Kim, University of Nebraska-Lincoln, Lincoln, NE, USA
    • Dr. Govindaraju Kondaswamy, Massey University, Palmerston, North New Zealand
    • Dr. Chaker Larabi, University of Poitiers, Poitiers, France
    • Dr. Robert J. Leichti, Simpson Strong-Tie Company Inc., Pleasanton, CA, USA
    • Dr. Gang Li, Xi’an Jiaotong University, Shaanxi Province, China
    • Dr. William Luecke, National Institute of Standards and Technology, Gaithersburg, MD, USA
    • Mr. Thomas F. O’Connor, Milan, MI, USA
    • Professor Khim Chey Gary Ong, National University of Singapore, Singapore
    • Dr. Andrew W. Phelps, University of Dayton Research Institute, Dayton, OHm USA
    • Prof. Hubert Rampersad, Academic Consortium of the Americas, Miramar, FL, USA
    • Mr. John Riegel, III, R3 Technology, Inc., Springfield, VA, USA
    • Dr. Roberto Sabatini, RMIT University, Melbourne, VIC, Australia
    • Dr. Rajarshi Saha, Georgia Institute of Technology, Atlanta, GA, USA
    • Dr. Christopher G. Scott, Lubrizol Corporation, Wickliffe, OH, USA
    • Dr. Steven J. Shaffer, Bruker Nano Surfaces Division, Campbell, CA, USA
    • Dr. Ranganath K. Shastri, Plastics Solutions, Midland, MI, USA
    • Dr. Punith V. Shivaprasad, Clemson University, Clemson, SC, USA
    • Dr. Cy (Chor-yiu) Sin, National Tsing Hua University, Hsinchu, Taiwan, R.O.C
    • Dr. Stein Sture, University of Colorado at Boulder, Boulder, CO, USA
    • Dr. Hao Wang, Rutgers, The State University of New Jersey, Piscataway, NJ, USA
    • Dr. Xuexin Wang, Xiamen University, Xiamen, China
    • Dr. Shaopeng Wu, Wuhan University of Technology, Wuhan, China
    • Dr. Ming Xiao, The Pennsylvania State University, University Park, PA, USA
    • Professor Feipeng Xiao, Clemson University, Clemson, SC, USA
    • Dr. Xiong Yu, Case Western Reserve University, Cleveland, OH, USA
    • Professor Menglan Zeng, Hunan University, Changsha, P.R. China
    • Dr. Xibin (Bill) Zhang, Monash University Caulfield East, Victoria, Australia