Journal of Testing
and Evaluation (JOTE)
Editor-in-Chief
Dr. M. R. Mitchell, Mechanics & Materials, LLC, Flagstaff, AZ, USA
Editorial Board Members
- Dr. Aziz Amoozegar, North Carolina State University, Raleigh, NC, USA
- Dr. Patricia A. Annis, University of Georgia, Athens, GA, USA
- Dr. Nemkumar Banthia, University of British Columbia, Vancouver, BC, Canada
- Dr. Neal S. Berke, Tourney Consulting Group, Ltd., Kalamazoo, MI, USA
- Dr. Laura Bix, Michigan State University, East Lansing, MI, USA
- Dr. Nick Birbilis, Monash University, Clayton, VIC 3800, Australia
- Dr. Andrew F. Braham, University of Arkansas, Fayetteville, AR, USA
- Dr. Andreas J. Brunner, EMPA, Swiss Federal Laboratories, Duebendorf, Switzerland
- Dr. Zongwu Cai, University of North Carolina at Charlotte, Charlotte, NC, USA
- Professor Andrea Carpinteri, University of Parma, Parma, ITALY
- Dr. Wen-Ruey Chang, Liberty Mutual Research Institute for Safety, Hopkinton, MA, USA
- Dr. Dar-Hao Chen, Texas Dept. of Transportation, Austin, TX, USA
- Mr. John S. Dick, Alpha Technologies, Akron, OH, USA
- Dr. Yu-Ning Louis Ge, National Taiwan University, Taipei, Taiwan
- Dr. T. Russell Gentry, Georgia Institute of Technology, Atlanta, GA, USA
- Dr. Markus B. Heinimann, Alcoa Technical Center, Alcoa Center, PA, USA
- Mr. Hui-Min (Hui) Huang, National Institute for Standards and Technology (NIST), Gaithersburg, MD, USA
- Dr. Shin-Che Huang, Western Research Institute, Laramie, WY, USA
- Dr. Jiancheng Jiang, University of North Carolina, Charlotte, Charlotte, NC, USA
- Mr. Thomas S. Jones, Howmet Research Corp., Whitehall, MI, USA
- Dr. Sivakumar Kandasami, L&T Construction, Chennai, India
- Dr. Sreeramesh Kalluri, Ohio Aerospace Institute, Brook Park, OH, USA
- Dr. Vistasp Karbhari, University of Alabama, Huntsville, AL, USA
- Dr. Edward J. Kikta, Jr., FMC Corporation, Ewing, NJ, USA
- Dr. Yong-Rak Kim, University of Nebraska-Lincoln, Lincoln, NE, USA
- Dr. Robert J. Leichti, Stanley Fastening Systems, East Greenwich, RI, USA
- Dr. Deyuan Li, Fudan University, Shanghai P.R. China
- Dr. Enrico Lucon, National Institute for Standards and Technology (NIST), Boulder, CO, USA
- Mr. Christopher McCowan, NIST, Boulder, CO, USA
- Mr. Thomas F. O’Connor, Milan, MI, USA
- Dr. Khim Chye Gary Ong, National University of Singapore, Singapore
- Dr. Andrew W. Phelps, University of Dayton Research Institute, Dayton, OH, USA
- Prof. Hubert Rampersad, Academic Consortium of the Americas, Miramar, FL, USA
- Dr. Rajarshi Saha, Georgia Institute of Technology, Atlanta, GA, USA
- Dr. Scott Schroeder, Exponent, Los Angeles, CA, USA
- Dr. Christopher G. Scott, Lubrizol Corporation, Wickliffe, OH, USA
- Dr. Ranganath K. Shastri, Plastics Solutions, Midland, MI, USA
- Dr. Punith V. Shivaprasad, Clemson University, Clemson, SC, USA
- Dr. Stein Sture, University of Colorado at Boulder, Boulder, CO, USA
- Dr. Marta L. Villarraga, Exponent Failure Analysis, Philadelphia, PA, USA
- Dr. Hao Wang, Rutgers, The State University of New Jersey, Piscataway, NJ, USA
- Dr. Shaopeng Wu, Wuhan University of Technology, Wuhan, China
- Professor Feipeng Xiao, Clemson University, Clemson, SC, USA
- Dr. Xiong Yu, Case Western Reserve University, Cleveland, OH, USA
- Professor Menglan Zeng, Hunan University, Changsha, P.R. China