Volume 42, Issue 4 (July 2014)

    Defect Prediction for New Products During the Development Phase

    (Received 18 April 2013; accepted 21 November 2013)

    Published Online: 2014

    CODEN: JTEOAD

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    Abstract

    Defect prediction is an important task in the development phase of new products. We present a new method of predicting the number of defects for new products in the computer industry, such as laptops, during the development phase. The proposed approach is based on robust regression and reliability growth models. We use a robust regression model to predict the number of defects for new products, and a growth model is used to track the test progress during the development phase. The Weibull growth model achieves the best fit compared with other models, such as the exponential, three-parameter logistic, and Gompertz model. The predicted defects for four example products are similar to the actual defects during the whole development phase. The Weibull growth curve also provides a good fit for monitoring defect trends.


    Author Information:

    Chu, Tao-Peng
    Department of Industrial Management, National Taiwan Univ. of Science and Technology, Taipei,

    Wang, Fu-Kwun
    Department of Industrial Management, National Taiwan Univ. of Science and Technology, Taipei,


    Stock #: JTE20130101

    ISSN: 0090-3973

    DOI: 10.1520/JTE20130101

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    Author
    Title Defect Prediction for New Products During the Development Phase
    Symposium , 0000-00-00
    Committee E11