Journal Published Online: 23 January 2015
Volume 44, Issue 3

Study of Preferred Profile of Accelerated Stability Test Method for Quartz Flexible Accelerometer

CODEN: JTEVAB

Abstract

Manufactured quartz flexible accelerometers have problems of poor long-term stability, which can be attributed to drifting of key parameters (e.g., zero bias, scale factor) that is influenced by a combination of time and external environmental stress inducing factors that include temperature fluctuation, thermal cycling, and dynamic mechanical loading. This paper focused on the experimental design for such a device. Accelerated stability experiments are performed and are divided into three kinds: thermal cycling test, test of concurrent application of thermal cycling and vibrational loading, and test of thermal cycling with subsequent vibrational loading. Experimental data are analyzed using the mobile linear regression coefficient test and the mobile standard deviation, after which the steady-state cycle number is determined. Based on the above analysis, the rapid effectiveness of the profiles is evaluated. Finally, the preferred profile is determined by thoroughly considering the equipment capacity and engineering operational convenience. It is illustrated that the vibrational loading has a significant effect on accelerated stability for various parameters. Overall, the research on the accelerated stability test enables an accelerometer to quickly attain a steady-state and also provides initial technical support to improve the robustness of the accelerometer's long-term stability.

Author Information

Xu, Dan
School of Reliability and Systems Engineering, Beihang Univ., Beijing, CN
Chen, Yunxia
School of Reliability and Systems Engineering, Beihang Univ., Beijing, CN
Kang, Rui
School of Reliability and Systems Engineering, Beihang Univ., Beijing, CN
Pages: 11
Price: $25.00
Related
Reprints and Permissions
Reprints and copyright permissions can be requested through the
Copyright Clearance Center
Details
Stock #: JTE20130083
ISSN: 0090-3973
DOI: 10.1520/JTE20130083