Volume 42, Issue 3 (May 2014)

    SkSP-V Sampling Plan for the Exponentiated Weibull Distribution

    (Received 1 March 2013; accepted 16 September 2013)

    Published Online: 2014

    CODEN: JTEOAD

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    Abstract

    The purpose of this paper is to design an SkSP-V acceptance sampling plan for assuring percentiles based on a time-truncated life test as the reference plan when the lifetime of a product follows an exponentiated Weibull distribution. Using the non-linear optimization solution, the plan parameters are determined so as to satisfy the producer's and the consumer's risks. Tables are provided for practical use and an example is shown with a real case. Finally, the results are compared with the single sampling plan in terms of the average sample number to demonstrate the efficiency of the proposed plan.


    Author Information:

    Aslam, Muhammad
    Dept. of Statistics, Forman Christian College Univ., Lahore,

    Rao, G. Srinivasa
    Dept. of Statistics, Dilla Univ., Dilla,

    Khan, Nasrullah
    Dept. of Statistics, National College of Business Administration and Economics, Lahore,

    Jun, Chi-Hyuck
    Dept. of Industrial and Management Engineering, POSTECH, Pohang,


    Stock #: JTE20130051

    ISSN: 0090-3973

    DOI: 10.1520/JTE20130051

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    Author
    Title SkSP-V Sampling Plan for the Exponentiated Weibull Distribution
    Symposium , 0000-00-00
    Committee A04