White OLED Weibull Life Prediction Using Maximum Likelihood Estimation

    Volume 41, Issue 1 (January 2013)

    ISSN: 0090-3973

    CODEN: JTEOAD

    Published Online: 11 December 2012

    Page Count: 5


    Zhang, Jian-ping
    School of Thermal Power and Environmental Engineering, Shanghai Univ. of Electric Power, Shanghai,

    Wu, Jiong-lei
    School of Thermal Power and Environmental Engineering, Shanghai Univ. of Electric Power, Shanghai,

    Liu, Yu
    Chinese Academy of Sciences, Shanghai Institute of Ceramics, Shanghai,

    Wu, Helen
    School of Engineering, Univ. of Western Sydney, Penrith, NSW

    Zhou, Aixi
    Dept. of Engineering Technology, Univ. of North Carolina at Charlotte, NC

    Wu, Wen-li
    School of Thermal Power and Environmental Engineering, Shanghai Univ. of Electric Power, Shanghai,

    (Received 26 August 2011; accepted 6 June 2012)

    Abstract

    A theoretical model using Weibull distribution and maximum likelihood estimation (MLE) was established to statistically analyze the test data, which were obtained by three groups of constant stress accelerated life tests. The life prediction software was applied to simplify the calculation and achieve organic light-emitting device (OLED) life estimation. The results indicate that the Weibull distribution is fit to describe white OLED life, and the precise accelerated parameter β is particularly useful to predict the white OLED life within a shorter time, which provides significant guidelines to help engineers make decisions in design and manufacturing strategy from the aspect of reliability life.


    Paper ID: JTE20120183

    DOI: 10.1520/JTE20120183

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    Author
    Title White OLED Weibull Life Prediction Using Maximum Likelihood Estimation
    Symposium , 0000-00-00
    Committee D01