ISSN: 1945-7553
CODEN: JTEVAB
Published Online: 11 December 2012
Page Count: 5

White OLED Weibull Life Prediction Using Maximum Likelihood Estimation

Zhang, Jian-ping
School of Thermal Power and Environmental Engineering, Shanghai Univ. of Electric Power, Shanghai,

Wu, Jiong-lei
School of Thermal Power and Environmental Engineering, Shanghai Univ. of Electric Power, Shanghai,

Liu, Yu
Chinese Academy of Sciences, Shanghai Institute of Ceramics, Shanghai,

Wu, Helen
School of Engineering, Univ. of Western Sydney, Penrith, NSW

Zhou, Aixi
Dept. of Engineering Technology, Univ. of North Carolina at Charlotte, NC

Wu, Wen-li
School of Thermal Power and Environmental Engineering, Shanghai Univ. of Electric Power, Shanghai,

(Received 26 August 2011; accepted 6 June 2012)

Abstract

A theoretical model using Weibull distribution and maximum likelihood estimation (MLE) was established to statistically analyze the test data, which were obtained by three groups of constant stress accelerated life tests. The life prediction software was applied to simplify the calculation and achieve organic light-emitting device (OLED) life estimation. The results indicate that the Weibull distribution is fit to describe white OLED life, and the precise accelerated parameter β is particularly useful to predict the white OLED life within a shorter time, which provides significant guidelines to help engineers make decisions in design and manufacturing strategy from the aspect of reliability life.

Keywords:
white OLED, life prediction, accelerated life test, MLE, Weibull distribution

Paper ID: JTE20120183
DOI: 10.1520/JTE20120183
ASTM International is a member of CrossRef.