Volume 41, Issue 1 (January 2013)

    White OLED Weibull Life Prediction Using Maximum Likelihood Estimation

    (Received 26 August 2011; accepted 6 June 2012)

    Published Online: 2012

    CODEN: JTEOAD

      Format Pages Price  
    PDF 5 $25   ADD TO CART


    Abstract

    A theoretical model using Weibull distribution and maximum likelihood estimation (MLE) was established to statistically analyze the test data, which were obtained by three groups of constant stress accelerated life tests. The life prediction software was applied to simplify the calculation and achieve organic light-emitting device (OLED) life estimation. The results indicate that the Weibull distribution is fit to describe white OLED life, and the precise accelerated parameter β is particularly useful to predict the white OLED life within a shorter time, which provides significant guidelines to help engineers make decisions in design and manufacturing strategy from the aspect of reliability life.


    Author Information:

    Zhang, Jian-ping
    School of Thermal Power and Environmental Engineering, Shanghai Univ. of Electric Power, Shanghai,

    Wu, Jiong-lei
    School of Thermal Power and Environmental Engineering, Shanghai Univ. of Electric Power, Shanghai,

    Liu, Yu
    Chinese Academy of Sciences, Shanghai Institute of Ceramics, Shanghai,

    Wu, Helen
    School of Engineering, Univ. of Western Sydney, Penrith, NSW

    Zhou, Aixi
    Dept. of Engineering Technology, Univ. of North Carolina at Charlotte, NC

    Wu, Wen-li
    School of Thermal Power and Environmental Engineering, Shanghai Univ. of Electric Power, Shanghai,


    Stock #: JTE20120183

    ISSN: 0090-3973

    DOI: 10.1520/JTE20120183

    ASTM International is a member of CrossRef.

    Author
    Title White OLED Weibull Life Prediction Using Maximum Likelihood Estimation
    Symposium , 0000-00-00
    Committee D01