Lifetime Prediction of White OLED Based on MLE Under Lognormal Distribution

    Volume 41, Issue 3 (May 2013)

    ISSN: 0090-3973

    CODEN: JTEOAD

    Published Online: 26 March 2013

    Page Count: 5


    Zhang, Jian-Ping
    School of Energy and Mechanical Engineering, Shanghai Univ. of Electric Power, Shanghai,

    School of Mechanical Engineering, Shanghai Jiaotong Univ., Shanghai,

    Li, Dong-Liang
    School of Energy and Mechanical Engineering, Shanghai Univ. of Electric Power, Shanghai,

    Wu, Wen-Li
    School of Energy and Mechanical Engineering, Shanghai Univ. of Electric Power, Shanghai,

    Wu, Helen
    School of Engineering, Univ. of Western Sydney, NSW

    Zhu, Wen-Qing
    Key Laboratory of Advanced Display and System Applications of EMC Shanghai Univ., Shanghai,

    (Received 30 March 2012; accepted 19 November 2012)

    Abstract

    To predict the lifetime of a white organic light-emitting diode (OLED) and reduce test time and cost, we conducted two constant stress and one step stress accelerated lifetime tests to obtain the failure time data of samples, described the lifetime distribution of white OLED with the lognormal distribution function, estimated the log mean and log standard deviation by using maximum likelihood estimation (MLE), achieved statistics and analysis of lifetime data, and developed lifetime prediction software by ourselves. Numerical results shows that white OLED lifetime follows the lognormal distribution, that the acceleration model is consistent with inverse power law, and that the acceleration parameters, which are accurately calculated, make fast estimation of white OLED lifetime possible.


    Paper ID: JTE20120095

    DOI: 10.1520/JTE20120095

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    Author
    Title Lifetime Prediction of White OLED Based on MLE Under Lognormal Distribution
    Symposium , 0000-00-00
    Committee E11