Volume 40, Issue 5 (September 2012)

    Mechanical Impedance Measurement on Thin Layer Surface With Impedance Hammer Device

    (Received 27 March 2012; accepted 30 April 2012)

    Published Online: 2012

    CODEN: JTEOAD

      Format Pages Price  
    PDF Version 6 $25   ADD TO CART


    Abstract

    The mechanical impedance describes the ability of a structure to resist motion when subjected to a given force. It has received increasing attention as a parameter that could influence the tire/road noise in the medium frequency range (630–1600 Hz). In this study, the impedance hammer device is used for measuring the mechanical impedance on thin layer surface mixture samples in the lab. In the test, the excitation is induced by hitting the sample surface with the hammer. Values of the driving force and acceleration of the vibrating slab are recorded. The mechanical impedance can then be calculated from the ratio of the force to the velocity that is obtained by integration of the acceleration. The influence of the material properties were investigated by comparing the results on different samples. A further measurement of dynamic stiffness on the same material is also discussed and related to the hammer measurement.


    Author Information:

    Li, Mingliang
    Section of Road and Railway Engineering, Faculty of Civil Engineering and Geosciences, Delft Univ. of Technology, GA Delft,

    Molenaar, A. A. A.
    Section of Road and Railway Engineering, Faculty of Civil Engineering and Geosciences, Delft Univ. of Technology, GA Delft,

    van de Ven, M. F. C.
    Section of Road and Railway Engineering, Faculty of Civil Engineering and Geosciences, Delft Univ. of Technology, GA Delft,

    van Keulen, Wim
    Vankeulen Advies B.V, Multatulistraat 5, 5251 WV Vlijmen,


    Stock #: JTE20120089

    ISSN: 0090-3973

    DOI: 10.1520/JTE20120089

    ASTM International is a member of CrossRef.

    Author
    Title Mechanical Impedance Measurement on Thin Layer Surface With Impedance Hammer Device
    Symposium , 0000-00-00
    Committee D04