Evaluation of Residual Stress in Fiber-Textured Films by X-ray Diffraction

    Volume 34, Issue 5 (September 2006)

    ISSN: 0090-3973

    CODEN: JTEOAD

    Published Online: 22 March 2006

    Page Count: 5


    Zhang, J-M
    College of Physics and Information Technology, Shannxi Normal University, Xian, Shaanxi

    Xu, K-W
    State Key Laboratory for Mechanical Behavior of Materials. Xian Jiaotong University, Xian, Shaanxi

    Ji, V
    LIM UMR 8006 ENSAM 151 bd. de L'Hôpital, Paris,

    (Received 28 October 2004; accepted 25 January 2006)

    Abstract

    The X-ray method is used extensively to determine the residual stress in bulk or thin film materials on the assumptions that the material is composed of fine crystals with random orientation and the stress state is biaxial and homogeneous through the X-ray penetrating region. But the method cannot be used in textured films due to oscillations in ε -sin2 Ψ relation. In this paper, a new method is proposed for measuring residual stress in cubic films with any [hkl] fiber texture.


    Paper ID: JTE13113

    DOI: 10.1520/JTE13113

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    Author
    Title Evaluation of Residual Stress in Fiber-Textured Films by X-ray Diffraction
    Symposium , 0000-00-00
    Committee E28