ISSN: 1945-7553
CODEN: JTEVAB
Page Count: 4

Back-Face Strain Compliance and Electrical-Potential Crack Length Calibrations for the Disk-Shaped Compact-Tension DC(T) Specimen

Gilbert, CJ
University of California, Berkeley, CA

McNaney, JM
University of California, Berkeley, CA

Dauskardt, RH
University of California, Berkeley, CA

Ritchie, RO
University of California, Berkeley, CA

(Received 20 July 1993; accepted 11 October 1993)

Abstract

Back-face strain compliance and electrical-potential crack length calibrations have been experimentally determined for the disk-shaped compact-tension DC(T) specimen. Finite-element modeling was used to ascertain the back-face strain distribution at several crack lengths to determine the significance of inconsistent gage placement. The numerical solutions demonstrated good agreement with experiment, especially at smaller crack lengths when the back-face strain gradients are minimal. It is concluded that precise gage placement is only critical when the crack tip closely approaches the back of the test specimen.

Keywords:
back-face strain compliance, electrical-potential calibration, disk-shaped compact-tension DC(T) specimen

Paper ID: JTE12644J
DOI: 10.1520/JTE12644J
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