Use of X-Ray Diffraction for Measuring Recrystallization of Low Carbon Steels for Tin Plate Application

    Volume 18, Issue 5 (September 1990)

    ISSN: 0090-3973

    CODEN: JTEOAD

    Page Count: 6


    Liao, KC
    Senior Research Metallurgist, National Steel Corporation, Trenton, MI

    (Received 23 September 1989; accepted 16 February 1990)

    Abstract

    An X-ray diffraction technique has been investigated as an alternative to the conventional Rockwell (R) superficial scale 30T hardness testing to evaluate the applicability of tin mill products. Cold-rolled low carbon steels for T-4 and T-5 tin plate applications were heat treated in a salt pot at temperatures ranging from 627 to 677°C for times between 1 and 120 s to simulate various continuous annealing cycles. X-ray diffraction patterns of the 211 line were obtained, and conventional R 30T hardness measurements were made on the cold reduced and annealed specimens. Test results show that an X-ray line broadening parameter can be established for monitoring the progress of recrystallization in the annealed steel.


    Paper ID: JTE12496J

    DOI: 10.1520/JTE12496J

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    Author
    Title Use of X-Ray Diffraction for Measuring Recrystallization of Low Carbon Steels for Tin Plate Application
    Symposium , 0000-00-00
    Committee E04