Novel Detection of Welding Seam Parameters Based on Active Infrared Technology

    Volume 31, Issue 6 (November 2003)

    ISSN: 0090-3973

    CODEN: JTEOAD

    Page Count: 6


    Jiang, J
    School of Electronics & Information Technology, Shanghai Jiaotong University, Shanghai,

    Ding, G

    Yan, G

    Chen, T

    Gan, X

    (Received 27 October 2002; accepted 10 June 2003)

    Abstract

    How to rapidly and with high precision detect various parameters of welding seams, such as the width, length, and offset is a significant challenge. This article first studies the microstructures and chemical components of welding seams. Then we discuss the effects of different microstructures and chemical components on active infrared images. Through theoretical and experimental analyses, it is well known that active infrared technology can be applied in the investigation of welding seams. Through the adaptive lifting discrete wavelet transform and the simple algorithm of iterative segment, various parameters of welding seams are established. The method put forth in the article is rapid, of high precision, on-line in real time. The precision is up to 0.1 mm. It takes only 0.02 s to segment an active infrared image on a P-III 700 personal computer.


    Paper ID: JTE12380J

    DOI: 10.1520/JTE12380J

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    Author
    Title Novel Detection of Welding Seam Parameters Based on Active Infrared Technology
    Symposium , 0000-00-00
    Committee E13