Evaluation of Sharp Indentation Testing of Thin Films and Ribbons on Hard Substrates

    Volume 30, Issue 1 (January 2002)

    ISSN: 0090-3973

    CODEN: JTEOAD

    Page Count: 10


    Larsson, PL
    Associate professor, Royal Institute of Technology (KTH), Stockholm,

    Peterson, IRM
    Researcher, Institute of Solid Mechanics, Romanian Academy of Sciences, Bucharest,

    (Received 10 April 2001; accepted 9 July 2001)

    Abstract

    A numerical investigation of sharp indentation of thin films and ribbons has been conducted using the finite element method. For a wide variety of material behavior, the critical ratio of indentation depth to thin film thickness is determined for the case of indentation of thin films or ribbons perfectly clamped on hard substrates. The critical ratio is defined as the ratio at which the indentation response can no longer be considered closely acceptable to the corresponding response at indentation of bulk materials. The indentation parameters investigated are hardness (average contact pressure), the size of the contact area between indenter and material, and the initial unloading slope of the indentation load-indentation depth curve. The implications of the results for material characterization of thin films and ribbons by indentation are discussed in some detail.


    Paper ID: JTE12290J

    DOI: 10.1520/JTE12290J

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    Author
    Title Evaluation of Sharp Indentation Testing of Thin Films and Ribbons on Hard Substrates
    Symposium , 0000-00-00
    Committee E04