(Received 20 September 2000; accepted 16 February 2001)
| ||Format||Pages||Price|| |
|PDF Version||5||$25||  ADD TO CART|
In using the direct current potential drop method for crack growth measurement, a suitable reference location on the test piece of a compact tension (CT) specimen seems difficult to find and yet is highly desirable for high-temperature long-term testing. This short report presents a possible solution that seems promising based on our preliminary test results. Vanations in the potential and current lead placement were also evaluated for some typical lead configurations in CT specimens.
University of Portsmouth, Portsmouth,
Stock #: JTE12269J