Volume 29, Issue 4 (July 2001)
Notes on Direct Current Potential Drop Calibration for Crack Growth in Compact Tension Specimens
In using the direct current potential drop method for crack growth measurement, a suitable reference location on the test piece of a compact tension (CT) specimen seems difficult to find and yet is highly desirable for high-temperature long-term testing. This short report presents a possible solution that seems promising based on our preliminary test results. Vanations in the potential and current lead placement were also evaluated for some typical lead configurations in CT specimens.