ISSN: 1945-7553
CODEN: JTEVAB
Published Online: 30 March 2005
Page Count: 5

Estimation of the Uncertainty of Fe in Metallic Silicon Determined by Inductively Coupled Plasmas-Atomic Emission Spectroscopy

Wang, DW
Liaoning Entry-Exit Inspection and Quarantine Bureau, Dalian, PR

Wang, SW
The Open University of Hong Kong, Hong Kong, PR

Zhao, SQ
Statistics, Animal Science, Shenyang Agriculture University, Shenyang, PR

(Received 7 July 2003; accepted 16 December 2004)

Abstract

This practice provides information for combining standard uncertainties of Fe in metallic silicon determined by the ICP-AES method of the China Inspection and Quarantine (CIQ). The measurand Fe% is determined from other quantities p.q.r. . . through a functional relationship of the model f: Fe% = f(p.q.r . . .). The estimated standard deviation associated with the output estimate Fe%, called combined standard uncertainty and denoted by uc (Fe%), is determined from the estimated standard deviation associated with each larger input estimate (p.q.r . . .). The combined variance u²_c (Fe%) can be viewed, by the sensitivity coefficients, as a sum of terms with the minor errors omitted.

Keywords:
round-robin, uncertainty, metallic, silicon, ICP-AES, Horwitz equation

Paper ID: JTE12061
DOI: 10.1520/JTE12061
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