Volume 33, Issue 3 (May 2005)
Estimation of the Uncertainty of Fe in Metallic Silicon Determined by Inductively Coupled Plasmas-Atomic Emission Spectroscopy
This practice provides information for combining standard uncertainties of Fe in metallic silicon determined by the ICP-AES method of the China Inspection and Quarantine (CIQ). The measurand Fe% is determined from other quantities p.q.r. . . through a functional relationship of the model f: Fe% = f(p.q.r . . .). The estimated standard deviation associated with the output estimate Fe%, called combined standard uncertainty and denoted by uc (Fe%), is determined from the estimated standard deviation associated with each larger input estimate (p.q.r . . .). The combined variance u2c (Fe%) can be viewed, by the sensitivity coefficients, as a sum of terms with the minor errors omitted.