Volume 33, Issue 3 (May 2005)

    Estimation of the Uncertainty of Fe in Metallic Silicon Determined by Inductively Coupled Plasmas-Atomic Emission Spectroscopy

    (Received 7 July 2003; accepted 16 December 2004)

    Published Online: 2005

    CODEN: JTEOAD

      Format Pages Price  
    PDF Version 5 $25   ADD TO CART


    Abstract

    This practice provides information for combining standard uncertainties of Fe in metallic silicon determined by the ICP-AES method of the China Inspection and Quarantine (CIQ). The measurand Fe% is determined from other quantities p.q.r. . . through a functional relationship of the model f: Fe% = f(p.q.r . . .). The estimated standard deviation associated with the output estimate Fe%, called combined standard uncertainty and denoted by uc (Fe%), is determined from the estimated standard deviation associated with each larger input estimate (p.q.r . . .). The combined variance u2c (Fe%) can be viewed, by the sensitivity coefficients, as a sum of terms with the minor errors omitted.


    Author Information:

    Wang, DW
    Liaoning Entry-Exit Inspection and Quarantine Bureau, Dalian, PR

    Wang, SW
    The Open University of Hong Kong, Hong Kong, PR

    Zhao, SQ
    Statistics, Animal Science, Shenyang Agriculture University, Shenyang, PR


    Stock #: JTE12061

    ISSN: 0090-3973

    DOI: 10.1520/JTE12061

    ASTM International is a member of CrossRef.

    Author
    Title Estimation of the Uncertainty of Fe in Metallic Silicon Determined by Inductively Coupled Plasmas-Atomic Emission Spectroscopy
    Symposium , 0000-00-00
    Committee E13