Volume 27, Issue 2 (March 1999)

    Failure Analysis Using Microfocus X-ray Imaging

    (Received 13 June 1998; accepted 23 December 1998)

    CODEN: JTEOAD

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    Abstract

    Failure analysis is an essential element of all engineered products. The goal of failure analysis is the understanding of the root causes of any undesirable effects. Microfocus X-ray imaging (radioscopy and computed tomography) offers detailed information on the internal assembly and material condition of objects under failure analysis investigation. Using advanced systems for the acquisition of radioscopic and computed tomography (CT) images, failure analysis investigations are improved in technical accuracy at a reduced flow time and cost over alternative approaches. A versatile microfocus radioscopic system with CT capability has been implemented successfully as a standard tool in the Boeing Phantom Works Failure Analysis Laboratory. Using this tool, studies of electronic, electromechanical, and composite material items have been performed. Such a system can pay for itself within two years through higher productivity of the laboratory, increased laboratory value to the company, and resolution of critical problems whose worth far exceeds the value of the equipment.


    Author Information:

    Bossi, RH
    Boeing Phantom Works, Seattle, WA


    Stock #: JTE12052J

    ISSN: 0090-3973

    DOI: 10.1520/JTE12052J

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    Author
    Title Failure Analysis Using Microfocus X-ray Imaging
    Symposium , 0000-00-00
    Committee F01