Uncertainty in Reference Values for the Charpy V-notch Verification Program

    Volume 34, Issue 3 (May 2006)

    ISSN: 0090-3973

    CODEN: JTEOAD

    Published Online: 5 December 2005

    Page Count: 4


    Splett, JD
    Statistical Engineering Division, National Institute of Standards and Technology, Boulder, CO

    Wang, CM
    Statistical Engineering Division, National Institute of Standards and Technology, Boulder, CO

    (Received 4 February 2003; accepted 25 August 2005)

    Abstract

    We present a method for computing the combined standard uncertainty for reference values used in the Charpy machine verification program administered by the National Institute of Standards and Technology. The technique is compliant with the ISO Guide to the Expression of Uncertainty in Measurement and models the between-machine bias using a Type B distribution. We demonstrate the method using actual data from the Charpy machine verification program.


    Paper ID: JTE11892

    DOI: 10.1520/JTE11892

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    Author
    Title Uncertainty in Reference Values for the Charpy V-notch Verification Program
    Symposium , 0000-00-00
    Committee E28