Volume 34, Issue 3 (May 2006)

    Uncertainty in Reference Values for the Charpy V-notch Verification Program

    (Received 4 February 2003; accepted 25 August 2005)

    Published Online: 2005

    CODEN: JTEOAD

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    Abstract

    We present a method for computing the combined standard uncertainty for reference values used in the Charpy machine verification program administered by the National Institute of Standards and Technology. The technique is compliant with the ISO Guide to the Expression of Uncertainty in Measurement and models the between-machine bias using a Type B distribution. We demonstrate the method using actual data from the Charpy machine verification program.


    Author Information:

    Splett, JD
    Statistical Engineering Division, National Institute of Standards and Technology, Boulder, CO

    Wang, CM
    Statistical Engineering Division, National Institute of Standards and Technology, Boulder, CO


    Stock #: JTE11892

    ISSN: 0090-3973

    DOI: 10.1520/JTE11892

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    Author
    Title Uncertainty in Reference Values for the Charpy V-notch Verification Program
    Symposium , 0000-00-00
    Committee E28