Journal Published Online: 05 December 2005
Volume 34, Issue 3

Uncertainty in Reference Values for the Charpy V-notch Verification Program

CODEN: JTEVAB

Abstract

We present a method for computing the combined standard uncertainty for reference values used in the Charpy machine verification program administered by the National Institute of Standards and Technology. The technique is compliant with the ISO Guide to the Expression of Uncertainty in Measurement and models the between-machine bias using a Type B distribution. We demonstrate the method using actual data from the Charpy machine verification program.

Author Information

Splett, JD
Statistical Engineering Division, National Institute of Standards and Technology, Boulder, CO
Wang, CM
Statistical Engineering Division, National Institute of Standards and Technology, Boulder, CO
Pages: 4
Price: $25.00
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Details
Stock #: JTE11892
ISSN: 0090-3973
DOI: 10.1520/JTE11892