Volume 32, Issue 3 (May 2004)

    Residual Stress Measurement in Ion-Exchanged Glass by Iterated Birefringence and Etching

    CODEN: JTEOAD

      Format Pages Price  
    PDF 7 $25   ADD TO CART


    Abstract

    Residual stresses play an important role in controlling fracture behavior in ion-exchanged glass. In this work, the internal tensile stress resulting from ion exchange is measured using conventional birefringence methods. By progressively etching thin layers from the glass surface, the compressive stress in the removed layer can then be determined from the change in the compensating internal tensile stress, producing a stress profile as a function of depth. Specimen geometry, surface roughness, and configuration of the optical system are examined in order to improve the accuracy of the method.


    Author Information:

    Abrams, M
    Graduate Research Assistant, Penn State University, PA

    Shen, J
    Graduate Research Assistant, Penn State University, PA,

    Green, D
    Professor, Penn State University, PA,


    Stock #: JTE11806

    ISSN: 0090-3973

    DOI: 10.1520/JTE11806

    ASTM International is a member of CrossRef.

    Author
    Title Residual Stress Measurement in Ion-Exchanged Glass by Iterated Birefringence and Etching
    Symposium , 0000-00-00
    Committee E28