Volume 20, Issue 4 (July 1992)

    Book Reviews

    CODEN: JTEOAD

      Format Pages Price  
    PDF 2 $25   ADD TO CART


    Author Information:

    Sinclair, JD
    Head of Materials Reliability and Electrochemistry Department, AT&T Bell Laboratories, Murray Hill, NJ

    Chaker, V
    Head of Materials Reliability and Electrochemistry Department, AT&T Bell Laboratories, Murray Hill, NJ

    Jenkins, TM
    Head of Materials Reliability and Electrochemistry Department, AT&T Bell Laboratories, Murray Hill, NJ


    Stock #: JTE11731J

    ISSN: 0090-3973

    DOI: 10.1520/JTE11731J

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    Author
    Title Book Reviews
    Symposium , 0000-00-00
    Committee A01B02C28D10D14D30E07E08F13