Book Reviews

Volume 20, Issue 4 (July 1992)

Click here to download this paper now for $25 PDF (156K)

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ISSN: 1945-7553
CODEN: JTEVAB
Page Count: 2

Book Reviews

Sinclair, JD
Head of Materials Reliability and Electrochemistry Department, AT&T Bell Laboratories, Murray Hill, NJ

Chaker, V
Head of Materials Reliability and Electrochemistry Department, AT&T Bell Laboratories, Murray Hill, NJ

Jenkins, TM
Head of Materials Reliability and Electrochemistry Department, AT&T Bell Laboratories, Murray Hill, NJ

Abstract

Keywords:

Paper ID: JTE11731J
DOI: 10.1520/JTE11731J
ASTM International is a member of CrossRef.

Author Title Book Reviews Symposium , 0000-00-00 Committee A01B02C28D10D14D30E07E08F13

		SEDL / Journals / Journal of Testing and Evaluation (JTE) / Citation Page Volume 20, Issue 4 (July 1992) Click here to download this paper now for $25 PDF (156K) View License Agreement ISSN: 1945-7553 CODEN: JTEVAB Page Count: 2 Book Reviews Sinclair, JD Head of Materials Reliability and Electrochemistry Department, AT&T Bell Laboratories, Murray Hill, NJ Chaker, V Head of Materials Reliability and Electrochemistry Department, AT&T Bell Laboratories, Murray Hill, NJ Jenkins, TM Head of Materials Reliability and Electrochemistry Department, AT&T Bell Laboratories, Murray Hill, NJ Abstract Keywords: Paper ID: JTE11731J DOI: 10.1520/JTE11731J ASTM International is a member of CrossRef. Author Title Book Reviews Symposium , 0000-00-00 Committee A01B02C28D10D14D30E07E08F13