Associate professor, Research Laboratory of Precision Machinery and Electronics, Tokyo Institute of Technology, Yokohama,
An optimal test method to determine the anisotropic parameters of the yield condition under a combined stress state is proposed. Because scattering of experimental values affects the calculated results, the combined stress tests should be conducted under conditions that minimize the scattering effect. Hill's anisotropic yield function is used to establish such a test condition.
Paper ID: JTE11653J