ISSN: 1945-7553
CODEN: JTEVAB
Page Count: 6

An Optimal Method for Determining Anisotropic Parameters Under Combined Stress Tests

Ikegami, K
Associate professor, Research Laboratory of Precision Machinery and Electronics, Tokyo Institute of Technology, Yokohama,

Abstract

An optimal test method to determine the anisotropic parameters of the yield condition under a combined stress state is proposed. Because scattering of experimental values affects the calculated results, the combined stress tests should be conducted under conditions that minimize the scattering effect. Hill's anisotropic yield function is used to establish such a test condition.

Keywords:
stresses, anisotropy, yield strength, combined stress tests, optimal method, data scattering

Paper ID: JTE11653J
DOI: 10.1520/JTE11653J
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